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ICSE 2020
Wed 24 June - Thu 16 July 2020
Tue 7 Jul 2020 15:12 - 15:24 at Goguryeo - A2-Testing and Debugging 1 Chair(s): Na Meng

Understanding the root cause of a defect is critical to isolating and repairing buggy behavior. We present Causal Testing, a new method of root-cause analysis that relies on the theory of counterfactual causality to identify a set of executions that likely hold key causal information necessary to understand and repair buggy behavior. Using the Defects4J benchmark, we find that Causal Testing could be applied to 71% of real-world defects, and for 77% of those, it can help developers identify the root cause of the defect. A controlled experiment with 37 developers shows that Causal Testing improves participants’ ability to identify the cause of the defect from 80% of the time with standard testing tools to 86% of the time with Causal Testing. The participants report that Causal Testing provides useful information they cannot get using tools such as JUnit. Holmes, our prototype, open-source Eclipse plugin implementation of Causal Testing, is available at http://holmes.cs.umass.edu/.

Tue 7 Jul

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15:00 - 16:00
15:00
12m
Talk
Studying the Use of Java Logging Utilities in the WildTechnical
Technical Papers
Boyuan Chen York University, Zhen Ming (Jack) Jiang York University
Authorizer link Pre-print
15:12
12m
Talk
Causal Testing: Understanding Defects' Root CausesACM SIGSOFT Distinguished Artifact AwardsArtifact ReusableTechnicalArtifact Available
Technical Papers
Brittany Johnson University of Massachusetts Amherst, Yuriy Brun University of Massachusetts Amherst, Alexandra Meliou University of Massachusetts Amherst
Link to publication DOI Pre-print Media Attached
15:24
8m
Talk
Studying the Characteristics of Logging Practices in Mobile Apps: A Case Study on F-Droid.J1
Journal First
Yi Zeng Concordia University, Jinfu Chen Concordia University, Canada, Weiyi Shang Concordia University, Tse-Hsun (Peter) Chen Concordia University
Authorizer link Pre-print
15:32
6m
Talk
Automatically Predicting Bug Severity Early in the Development ProcessNIER
New Ideas and Emerging Results
Jude Arokiam Ontario Tech University, Jeremy Bradbury Ontario Tech University
15:38
8m
Talk
A Survey on Adaptive Random TestingJ1
Journal First
Rubing Huang Jiangsu University, Weifeng Sun Jiangsu University, Yinyin Xu Jiangsu University, Haibo Chen Jiangsu University, Dave Towey University of Nottingham Ningbo China, Xin Xia Monash University
15:46
12m
Talk
Code Level Model-Checking in the Software Development WorkflowArtifact ReusableArtifact AvailableSEIP
Software Engineering in Practice
Nathan Chong Amazon, Byron Cook Amazon, Konstantinos Kallas University of Pennsylvania, Kareem Khazem Amazon, Felipe R. Monteiro Amazon, Daniel Schwartz-Narbonne Amazon, n.n., Serdar Tasiran Amazon, n.n., Michael Tautschnig Amazon Web Services, Mark R. Tuttle Amazon
Pre-print Media Attached