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ICSE 2020
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ICSE 2020
(
series
) /
AST 2020 (
series
) /
ACM/IEEE International Conference on Automation of Software Test AST 2020
/
Program Committee
AST
Benoit Baudry
KTH Royal Institute of Technology
Sweden
Christof J. Budnik
Siemens Corporation, Corporate Technology
United States
Wing-Kwong Chan
City University of Hong Kong, Hong Kong
China
Myra Cohen
Iowa State University
United States
Maxime Cordy
SnT, University of Luxembourg
Hyunsook Do
University of North Texas
United States
André T. Endo
Federal University of Technology - Paraná (UTFPR)
Brazil
Eunkyoung Jee
KAIST, South Korea
South Korea
Piotr Jędrzejowicz
Gdynia Maritime University
Gregory Kapfhammer
Allegheny College, USA
United States
Mijung Kim
Purdue University
United States
Taeksu Kim
Samsung Research, Samsung Electronics
South Korea
Chung Lee
California State Polytechnic University
United States
Yepang Liu
Southern University of Science and Technology
Francesca Lonetti
CNR-ISTI
Italy
Jie M. Zhang
University College London, UK
United Kingdom
José Carlos Maldonado
Loggi Tecnologia and University of São Paulo - USP and
Brazil
Leonardo Mariani
University of Milano Bicocca
Italy
Wes Masri
American University of Beirut
Lebanon
Sachoun Park
Samsung Electronics
Chris Poskitt
Singapore Management University
Singapore
Francesca Saglietti
University of Erlangen-Nuremberg, Germany
Cristina Seceleanu
Mälardalen University
Sweden
Saurabh Sinha
IBM Research
United States
Jun Sun
Singapore Management University
Singapore
Dragos Truscan
Abo Akademi University
Andreas Ulrich
Siemens AG
W. Eric Wong
University of Texas at Dallas
United States
Cemal Yilmaz
Sabancı University
Shin Yoo
Korea Advanced Institute of Science and Technology
South Korea
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Sat 23 Nov 12:28