TRADER: Trace Divergence Analysis and Embedding Regulation for Debugging Recurrent Neural NetworksTechnical
Recurrent Neural Networks (RNN) can deal with (textual) input with various length and hence have a lot of applications in software systems and software engineering applications. RNNs depend on word embeddings that are usually pre-trained by third parties to encode textual inputs to numerical values. It is well known that problematic word embeddings can lead to low model accuracy. In this paper, we propose a new technique to automatically diag- nose how problematic embeddings impact model performance, by comparing model execution traces from correctly and incorrectly executed samples. We then leverage the diagnosis results as guid- ance to harden/repair the embeddings. Our experiments show that TRADER can consistently and effectively improve accuracy for real world models and datasets by 5.37% on average, which represents substantial improvement in the literature of RNN models.
Fri 10 JulDisplayed time zone: (UTC) Coordinated Universal Time change
16:05 - 17:05 | A24-Testing and Debugging 4Technical Papers / New Ideas and Emerging Results / Journal First / Demonstrations at Silla Chair(s): Yijun Yu The Open University, UK | ||
16:05 6mTalk | Manifold for Machine Learning AssuranceNIER New Ideas and Emerging Results | ||
16:11 12mTalk | On Learning Meaningful Assert Statements for Unit Test CasesTechnical Technical Papers Cody Watson Washington and Lee University, Michele Tufano Microsoft, Kevin Moran William & Mary/George Mason University, Gabriele Bavota Università della Svizzera italiana, Denys Poshyvanyk William and Mary Pre-print Media Attached | ||
16:23 12mTalk | TRADER: Trace Divergence Analysis and Embedding Regulation for Debugging Recurrent Neural NetworksTechnical Technical Papers Guanhong Tao Purdue University, Shiqing Ma Rutgers University, Yingqi Liu Purdue University, USA, Qiuling Xu Purdue University, Xiangyu Zhang Purdue University Pre-print | ||
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16:46 8mTalk | ProXray: Protocol Model Learning and Guided Firmware AnalysisJ1 Journal First Farhaan Fowze University of Florida, Dave (Jing) Tian Purdue University, Grant Hernandez University of Florida, Kevin Butler Univ. Florida, Tuba Yavuz University of Florida | ||
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