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ICSE 2020
Wed 24 June - Thu 16 July 2020
Thu 9 Jul 2020 07:12 - 07:24 at Baekje - I13-Testing and Debugging 1 Chair(s): Shin Hwei Tan

When a program fails to process an input, it need not be the program code that is at fault. It can also be that the input data is faulty, for instance as result of data corruption. To get the data processed, one then has to debug the input data—that is,

  1. identify which parts of the input data prevent processing, and
  2. recover as much of the (valuable) input data as possible.

In this paper, we present a general-purpose algorithm called ddmax that addresses these problems automatically. Through experiments, ddmax maximizes the subset of the input that can still be processed by the program, thus recovering and repairing as much data as possible; the difference between the original failing input and the “maximized” passing input includes all input fragments that could not be processed. To the best of our knowledge, ddmax is the first approach that fixes faults in the input data without requiring program analysis. In our evaluation, ddmax repaired about 69% of input files and recovered about 78% of data within one minute per input.

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Thu 9 Jul
Times are displayed in time zone: (UTC) Coordinated Universal Time change

07:00 - 08:00: I13-Testing and Debugging 1Paper Presentations / Demonstrations / Technical Papers / Software Engineering in Practice / Journal First at Baekje
Chair(s): Shin Hwei TanSouthern University of Science and Technology
07:00 - 07:12
Technical Papers
Antonia BertolinoCNR-ISTI, Antonio GuerrieroUniversità di Napoli Federico II, Breno MirandaFederal University of Pernambuco, Roberto PietrantuonoUniversità di Napoli Federico II, Stefano RussoUniversità di Napoli Federico II
07:12 - 07:24
Technical Papers
Lukas KirschnerSaarland University, Ezekiel O. SoremekunCISPA Helmholtz Center for Information Security, Andreas ZellerCISPA Helmholtz Center for Information Security
Link to publication DOI Pre-print
07:24 - 07:36
Software Engineering in Practice
Mingyu ParkLG Electronics, Hoon JangHyundai Motor Company, Taejoon ByunUniversity of Minnesota, Yunja ChoiKyungpook National University
07:36 - 07:44
Journal First
Sangameshwar PatilDept. of CSE, IIT Madras and TRDDC, TCS, Balaraman RavindranIIT Madras
07:44 - 07:52
Journal First
Valentin ManèsCSRC, KAIST, HyungSeok HanKAIST, Choongwoo HanNAVER Corporation, Sang Kil ChaKAIST, Manuel EgeleBoston University, USA, Edward SchwartzCarnegie Mellon University, Maverick WooCarnegie Mellon University
07:52 - 07:55
Yung-Pin ChengNational Central University, Wei-Nien HsiungNational Central University, Yu-Shan WuIsCoollab Co. Ltd, Li-Hsuan ChenIsCoollab Co. Ltd