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ICSE 2020
Wed 24 June - Thu 16 July 2020
Thu 9 Jul 2020 07:12 - 07:24 at Baekje - I13-Testing and Debugging 1 Chair(s): Shin Hwei Tan

When a program fails to process an input, it need not be the program code that is at fault. It can also be that the input data is faulty, for instance as result of data corruption. To get the data processed, one then has to debug the input data—that is,

  1. identify which parts of the input data prevent processing, and
  2. recover as much of the (valuable) input data as possible.

In this paper, we present a general-purpose algorithm called ddmax that addresses these problems automatically. Through experiments, ddmax maximizes the subset of the input that can still be processed by the program, thus recovering and repairing as much data as possible; the difference between the original failing input and the “maximized” passing input includes all input fragments that could not be processed. To the best of our knowledge, ddmax is the first approach that fixes faults in the input data without requiring program analysis. In our evaluation, ddmax repaired about 69% of input files and recovered about 78% of data within one minute per input.

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Thu 9 Jul

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07:00 - 08:00
I13-Testing and Debugging 1Demonstrations / Technical Papers / Software Engineering in Practice / Journal First at Baekje
Chair(s): Shin Hwei Tan Southern University of Science and Technology
Learning-to-Rank vs Ranking-to-Learn: Strategies for Regression Testing in Continuous IntegrationTechnical
Technical Papers
Antonia Bertolino CNR-ISTI, Antonio Guerriero Università di Napoli Federico II, Breno Miranda Federal University of Pernambuco, Roberto Pietrantuono Università di Napoli Federico II, Stefano Russo Università di Napoli Federico II
Debugging InputsArtifact ReusableTechnicalArtifact Available
Technical Papers
Lukas Kirschner Saarland University, Ezekiel Soremekun CISPA Helmholtz Center for Information Security, Andreas Zeller CISPA Helmholtz Center for Information Security
Link to publication DOI Pre-print
Property-based Testing for LG Home Appliances using Accelerated Software-in-the-Loop SimulationIEEE Software Best Software Engineering in Practice AwardSEIP
Software Engineering in Practice
Mingyu Park LG Electronics, Hoon Jang Hyundai Motor Company, Taejoon Byun University of Minnesota, Yunja Choi Kyungpook National University
Predicting Software Defect Type using Concept-based ClassificationJ1
Journal First
Sangameshwar Patil Dept. of CSE, IIT Madras and TRDDC, TCS, Balaraman Ravindran IIT Madras
The Art, Science, and Engineering of Fuzzing: A SurveyJ1
Journal First
Valentin Manès CSRC, KAIST, HyungSeok Han KAIST, Choongwoo Han NAVER Corporation, Sang Kil Cha KAIST, Manuel Egele Boston University, USA, Edward Schwartz Carnegie Mellon University, Maverick Woo Carnegie Mellon University
GeekyNote: A Technical Documentation Tool with Coverage, Backtracking, Traces, and CouplingsDemo
Yung-Pin Cheng National Central University, Wei-Nien Hsiung National Central University, Yu-Shan Wu IsCoollab Co. Ltd, Li-Hsuan Chen IsCoollab Co. Ltd