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ICSE 2020
Wed 24 June - Thu 16 July 2020
Sat 11 Jul 2020 00:48 - 01:00 at Goguryeo - P26-Deep Learning Testing and Debugging Chair(s): Tim Menzies

Significant interest in applying Deep Neural Network (DNN) has fueled the need to support engineering of software that uses DNNs. Repairing software that uses DNNs is one such unmistakable SE need where automated tools could be very helpful; however, we do not fully understand challenges to repairing and patterns that are utilized when manually repairing them. What challenges should automated repair tools address? What are the repair patterns whose automation could help developers? Which repair patterns should be assigned a higher priority for automation? This work presents a comprehensive study of bug fix patterns to address these questions. We have studied 415 repairs from StackOverflow and 555 repairs from GitHub for five popular deep learning libraries Caffe, Keras, TensorFlow, Theano, and Torch to understand challenges in repairs and bug repair patterns. Our key findings reveal that DNN bug fix patterns are distinctive compared to traditional bug fix patterns; the most common bug fix patterns are fixing data dimension and neural network connectivity; DNN bug fixes have the potential to introduce adversarial vulnerabilities; DNN bug fixes frequently introduce new bugs; and DNN bug localization, reuse of trained model, and coping with frequent releases are major challenges faced by developers when fixing bugs. We also contribute a benchmark of 667 DNN (bug, repair) instances.

Sat 11 Jul

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00:00 - 01:00
P26-Deep Learning Testing and DebuggingTechnical Papers at Goguryeo
Chair(s): Tim Menzies North Carolina State University
00:00
12m
Talk
ReluDiff: Differential Verification of Deep Neural NetworksArtifact ReusableTechnical
Technical Papers
Brandon Paulsen University of Southern California, Jingbo Wang University of Southern California, Chao Wang USC
Pre-print
00:12
12m
Talk
Structure-Invariant Testing for Machine TranslationTechnical
Technical Papers
Pinjia He ETH Zurich, Clara Meister ETH Zurich, Zhendong Su ETH Zurich, Switzerland
00:24
12m
Talk
Automatic Testing and Improvement of Machine TranslationTechnical
Technical Papers
Zeyu Sun Peking University, Jie M. Zhang University College London, UK, Mark Harman Facebook and University College London, Mike Papadakis University of Luxembourg, Lu Zhang Peking University, China
00:36
12m
Talk
Testing DNN Image Classifier for Confusion & Bias ErrorsArtifact ReusableTechnicalArtifact Available
Technical Papers
Yuchi Tian Columbia University, Ziyuan Zhong Columbia University, Vicente Ordonez University of Virginia, Gail Kaiser Columbia University, Baishakhi Ray Columbia University, New York
00:48
12m
Talk
Repairing Deep Neural Networks: Fix Patterns and ChallengesArtifact ReusableTechnicalArtifact Available
Technical Papers
Md Johirul Islam Iowa State University, Rangeet Pan Iowa State University, USA, Giang Nguyen Dept. of Computer Science, Iowa State University, Hridesh Rajan Iowa State University, USA