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ICSE 2020
Wed 24 June - Thu 16 July 2020
Wed 8 Jul 2020 17:10 - 18:00 at SRC Poster Special Room - A305-SRC-Posters

The software quality and reliability has been proved to be important during the program development. There are many existing studies trying to help improve it on bug detection and automated program repair processes. However, each of them has its own limitation and the overall performance still have some improvement space. In this paper, we proposed a deep learning framework to improve the software quality and reliability on these two detect-fix processes. We used advanced code modeling and AI models to have some improvements on the state-of-the-art approaches. The evaluation results shows that our approach can have a relative improvement up to 206% on F-1 score when comparing with baselines on bug detection and can have a relative improvement up to 19.8 times on correct bug-fixing amount when comparing with baselines on automated program repair. These results can prove that our framework can have a outstanding performance on improving software quality and reliability in bug detection and automated program repair processes.

Wed 8 Jul

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17:10 - 18:00
17:10
50m
Poster
Improving Bug Detection and Fixing via Code Representation Learning
ACM Student Research Competition
Yi Li New Jersey Institute of Technology, USA
17:10
50m
Poster
Automatic Generation of Simulink Models to Find Bugs in Cyber-Physical System Tool Chain using Deep Learning
ACM Student Research Competition
Sohil Lal Shrestha The University of Texas at Arlington
DOI Pre-print
17:10
50m
Poster
Studying and Suggesting Logging Locations in Code Blocks
ACM Student Research Competition
Zhenhao Li Concordia University
17:10
50m
Poster
An Automated Framework For Gaming Platform To Test Multiple Games
ACM Student Research Competition
Zihe Song The University of Texas at Dallas
17:10
50m
Poster
Efficient test execution in End to End testing
ACM Student Research Competition
Cristian Augusto University of Oviedo
17:10
50m
Poster
An Empirical Study on the Evolution of Test Smell
ACM Student Research Competition
Dong Jae Kim Concordia University